ctest_memcheck

執行 CTest 記憶體檢查步驟 作為 儀表板用戶端

ctest_memcheck([BUILD <build-dir>] [APPEND]
               [START <start-number>]
               [END <end-number>]
               [STRIDE <stride-number>]
               [EXCLUDE <exclude-regex>]
               [INCLUDE <include-regex>]
               [EXCLUDE_LABEL <label-exclude-regex>]
               [INCLUDE_LABEL <label-include-regex>]
               [EXCLUDE_FIXTURE <regex>]
               [EXCLUDE_FIXTURE_SETUP <regex>]
               [EXCLUDE_FIXTURE_CLEANUP <regex>]
               [PARALLEL_LEVEL <level>]
               [RESOURCE_SPEC_FILE <file>]
               [TEST_LOAD <threshold>]
               [SCHEDULE_RANDOM <ON|OFF>]
               [STOP_ON_FAILURE]
               [STOP_TIME <time-of-day>]
               [RETURN_VALUE <result-var>]
               [CAPTURE_CMAKE_ERROR <result-var>]
               [REPEAT <mode>:<n>]
               [OUTPUT_JUNIT <file>]
               [DEFECT_COUNT <defect-count-var>]
               [QUIET]
               )

使用動態分析工具執行測試,並將結果儲存在 MemCheck.xml 中,以便使用 ctest_submit() 命令提交。

大多數選項與 ctest_test() 命令的選項相同。

此命令特有的選項為

DEFECT_COUNT <defect-count-var>

在 3.8 版本中新增。

將找到的缺陷數量儲存在 <defect-count-var> 中。